Supply of the Electron Backscatter Diffraction detector on the existing scanning electron microscope (SEM) in the MCL laboratory

• Country: Netherlands
• Summary: Supply of the Electron Backscatter Diffraction detector on the existing scanning electron microscope (SEM) in the MCL laboratory
• NLT Ref No: 90950119
• Deadline: 03 Nov 2023
• Financier: Self Financed
• Purchaser Ownership: Government
• Tender Value: Refer Document
• Notice Type: Tender
• Document Ref. No.: JRC/PTT/2023/MVP/2666-ExA
• Purchaser's Detail:
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• Description:
• Please note that this is not a call for tenders but a publication announcing the Contracting authority-s intention to publish a future negotiated low or middle valueprocedure. Recent open access projects (CANMECH, SAHARA, CHRONIC and NIFEM) resulted in requests for high-throughput electron backscatter diffraction (EBSD) screening analyses beyond the anticipated needs. These requests come in addition to the activities planned based upon institutional (INVISION) and competitive projects (NUCOBAM and INNUMAT), which saturates the availability of the EBSD system on the Plasma focused ion beam - scanning electron microscopy (PFIB-SEM, installed in 312-031). Requests for screening EBSD measurements beyond the anticipated needs stems from the increased variety in materials investigated promoted by open-access projects, compared to institutional and competitive activities for which the existing SEM (312-028) and PFIB (312-031) combination has been configured for. This is particularly true for Open-Access projects with methodological rather than case study synergies with G.I.4 activities. The EBSD detector on the PFIB-SEM is geared towards high spatial and angular resolution and 3-D imaging, which is not needed for screening analyses. Further, the PFIB-SEM is a heavily-used and advanced instrument (often runnign 24/7 using automation and further periodic downtimes for maintenance), procured primarily for other demanding tasks, including micro-fabrication, 3-D imaging, lamella preparation and high-resolution imaging of ion-polished cross-sections. Therefore, screening EBSD measurements block the PFIB-SEM and affect its availability for fulfilling its main purpose. The development of the situation is anticipated to lead soon to the rejection of measurements requests beyond the reasonable for Open Access and/or competitive activities. The proposed solution is the installation of a dedicated entry-level EBSD system on the SEM installed in 312-028. Benefits are anticipated on several fronts. First, the pressure on the PFIB-SEM for tasks outside its main purpose will be alleviated. Second, the SEM can be manipulated by Open-Access users after adequate training, which is not tractable with the PFIB-SEM because of its use case at G.I.4 (prototyping and 3-D measurements campaigns over several weeks) and higher complexity and maintenance needs.
• Documents:

 Tender Notice